Kirk and Fred discussing how new technology designs of buildings or electronics are usually over-designed in the first generation.
Join Kirk and Fred as they discuss the possible causes of design failure patterns
Topics include:
Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.
Here is a link to the graphic illustration of failure analysis of the collapse of the Florida Condominium from the New York Times
Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled “Reliability Prediction – A Continued Reliance on a Misleading Approach”
For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.
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